MATRIX-EFFECT CORRECTION IN OXIDE CRYSTAL AUGER-ELECTRON SPECTROSCOPY

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Author list: ANDERSEN JET

Publisher: Elsevier

Place: AMSTERDAM

Publication year: 1991

Journal: Surface Science (0039-6028)

Journal acronym: SURF SCI

Volume number: 243

Issue number: 1-3

Start page: 337

End page: 349

Number of pages: 13

ISSN: 0039-6028

eISSN: 1879-2758

Languages: English-Great Britain (EN-GB)

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Abstract

A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO3(100), LaAlO3(100), and YBa2Cu3O7-x(001) are used as test samples. Uncertainties are estimated at 10-20%.

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