Optical properties and Raman studies of amorphous Se-Bi thin films

Journal article

Authors/Editors

Muiva, Cosmas

Research Areas

ENGINEERING AND TECHNOLOGY (Frascati classification)

Publication Details

Subtitle: Optical properties and Raman studies of amorphous Se-Bi thin films

Publisher: American Physical Society

Publication year: 2012

Journal: Reviews of Modern Physics (0034-6861)

Volume number: 8

Issue number: 5

Start page: 135

End page: 146

Number of pages: 12

ISSN: 0034-6861

eISSN: 1539-0756

Languages: English-United States (EN-US)

Abstract

Flash evaporated amorphous Se100-xBix(x = 0, 1, 2, 3, and 4 at.%) thin films of 350 ± 10nm thickness have been investigated in the wavelength range of 200nm - 3000nm. It is found that the effect of increasing bismuth content on the as deposited films led to increased absorption coefficient, reflectance, refractive index and extinction coefficient while transmittance and optical band gap energy decreased. The Raman spectra showed peaks at 238.8cm-1, 248.3cm-1, 249.5cm-1, 250.7cm-1, 251.9cm-1, 488.1cm-1, and 489.3cm-1 due to selenium rings and chains at various bismuth concentrations.

Keywords

Optical properties, Chalcogenide glasses, Thin films, Refractive index, Optical conductivity.

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